A state of the art DUAL SENSOR TTV metrology for SIMULTANEOUS dual side geometry measurements
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The AOP-Thickness platform is equipped with a high precision XY stage with a measurement range up to 400 mm x 400 mm. Two high speed line or point sensors enable height measuring ranges between 2 mm and 145 mm with vertical resolutions of 0.2 µm up to 5 µm. Solarius SolarScan software provides automation features as well as customized recipes. The modular system design offers the highest flexibility for customized analysis tools.
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